MARC details
| 000 -LEADER |
| fixed length control field |
01797cam a2200421 a 4500 |
| 001 - CONTROL NUMBER |
| control field |
4410 |
| 003 - CONTROL NUMBER IDENTIFIER |
| control field |
BD-DhEWU |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20171214155346.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
941201t19941990nyua g b 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
0780310624 |
|
| International Standard Book Number |
9780780310629 |
| 035 ## - SYSTEM CONTROL NUMBER |
| System control number |
(OCoLC)31415783 |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
DLC |
| -- |
BD-DhEWU |
| Language of cataloging |
eng |
| 041 ## - LANGUAGE CODE |
| Language code of text/sound track or separate title |
eng |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER |
| Classification number |
TK7874 |
| Item number |
.A23 1990b |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
| Classification number |
621.3815 |
| Item number |
ABD 1990 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
| Personal name |
Abramovici, Miron. |
| 9 (RLIN) |
9543 |
| 245 10 - TITLE STATEMENT |
| Title |
Digital systems testing and testable design / |
| Statement of responsibility, etc |
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. |
| 250 ## - EDITION STATEMENT |
| Edition statement |
Rev. print. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
| Place of publication, distribution, etc |
New York : |
| Name of publisher, distributor, etc |
IEEE Press, |
| Date of publication, distribution, etc |
[1994], c1990. |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xviii, 652 p. : |
| Other physical details |
ill. ; |
| Dimensions |
27 cm. |
| 500 ## - GENERAL NOTE |
| General note |
"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
| Bibliography, etc |
Includes bibliographical references and index. |
| 526 ## - STUDY PROGRAM INFORMATION NOTE |
| Program name |
EEE |
| 590 ## - LOCAL NOTE (RLIN) |
| Local note |
Tahur Ahmed |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name as entry element |
Digital integrated circuits |
| General subdivision |
Testing. |
| 9 (RLIN) |
9544 |
|
| Topical term or geographic name as entry element |
Digital integrated circuits |
| General subdivision |
Design and construction. |
| 9 (RLIN) |
9517 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
| Personal name |
Breuer, Melvin A. |
| 9 (RLIN) |
9545 |
|
| Personal name |
Friedman, Arthur D. |
| 9 (RLIN) |
9546 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
| Materials specified |
Contributor biographical information |
| Uniform Resource Identifier |
http://www.loc.gov/catdir/bios/wiley045/94233953.html |
|
| Materials specified |
Publisher description |
| Uniform Resource Identifier |
http://www.loc.gov/catdir/description/wiley039/94233953.html |
|
| Materials specified |
Table of Contents |
| Uniform Resource Identifier |
http://www.loc.gov/catdir/toc/onix07/94233953.html |
|
| Materials specified |
WorldCat details |
| Uniform Resource Identifier |
http://www.worldcat.org/title/digital-systems-testing-and-testable-design/oclc/31415783&referer=brief_results |
|
| Materials specified |
E-Book Fulltext |
| Uniform Resource Identifier |
http://lib.ewubd.edu/ebook/4410 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Text |