Digital systems testing and testable design /
Abramovici, Miron.
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York : IEEE Press, [1994], c1990. - xviii, 652 p. : ill. ; 27 cm.
"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.
Includes bibliographical references and index.
0780310624 9780780310629
94233953
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A23 1990b
621.3815 / ABD 1990
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York : IEEE Press, [1994], c1990. - xviii, 652 p. : ill. ; 27 cm.
"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.
Includes bibliographical references and index.
0780310624 9780780310629
94233953
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A23 1990b
621.3815 / ABD 1990