000			01797cam a2200421 a 4500
001			4410
003			BD-DhEWU
005			20171214155346.0
008			941201t19941990nyua g b 001 0 eng d
010			_a 94233953
020			_a0780310624
020			_a9780780310629
035			_a(OCoLC)31415783
040			_aDLC _cDLC _dDLC _dBD-DhEWU _beng
041			_aeng
050	0	0	_aTK7874 _b.A23 1990b
082			_a621.3815 _bABD 1990
100	1		_aAbramovici, Miron. _99543
245	1	0	_aDigital systems testing and testable design / _cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
250			_aRev. print.
260			_aNew York : _bIEEE Press, _c[1994], c1990.
300			_axviii, 652 p. : _bill. ; _c27 cm.
500			_a"This is the IEEE revised printing of the book previously published by W.H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--T.p. verso.
504			_aIncludes bibliographical references and index.
526			_aEEE
590			_aTahur Ahmed
650		0	_aDigital integrated circuits _xTesting. _99544
650		0	_aDigital integrated circuits _xDesign and construction. _99517
700	1		_aBreuer, Melvin A. _99545
700	1		_aFriedman, Arthur D. _99546
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley045/94233953.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley039/94233953.html
856	4		_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix07/94233953.html
856	4		_3WorldCat details _uhttp://www.worldcat.org/title/digital-systems-testing-and-testable-design/oclc/31415783&referer=brief_results
856	4	0	_3E-Book Fulltext _uhttp://lib.ewubd.edu/ebook/4410
942			_2ddc _cTEXT
999			_c4410 _d4410
999			_c4410 _d4410